| Title | Automated Design Approximation to Overcome Circuit Aging |
|---|---|
| DOI | https://doi.org/10.1109/tcsi.2021.3106149 |
| Raw Affiliation | Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany |
| Clean Page Target | Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany |