InstitutionDoi/2025: Difference between revisions
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Latest revision as of 10:36, 28 May 2026
| Title | Automated Design Approximation to Overcome Circuit Aging |
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| DOI | https://doi.org/10.1109/tcsi.2021.3106149 |
| Raw Affiliation | Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany |
| Clean Page Target | Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany |